Products Catalog

Specification

Non contact XYZ depth measuring microscope

FEATURES

� Ideal microscope for measuring precision components in 2 and 3 dimensions
� Specifically designed for accurate and repeatable measurements of thickness and depth
� Measures surface profile, flatness, roughness and alignment in X, Y and Z-Axis
� Z-Axis measurement with the Precise Focusing Image Module
� Three objective lenses available 5x, 20x, 50x
� Communication protocol with Nikon Data-Process system
� Obtains high accurate depth measurements simply by coinciding the upper and lower portions of a graticule

Applications :

Various measurements such as :
- Height of lead frame
- Wafer bump height
- Height of solder
- Strain of lead frame
- Height of bonded portion of lead wire
- Steps on hybrid IC
- Terminal steps on multi-layer pc boards
- Recesses on cans
- Depth of metallic moulds

Standard Delivery :

� Main body focus unit with reflector
� Stand with transformer
� Nosepiece quintuple
� Optical body binocular
� Measuring stage 150mmx100mm with linear scale and stage glass
� 2-axis counter ( Nikon)
� Z-axis indicator 25mm travel
� Eyepiece WF10x ( Field 18)
� Eyepiece WF10X reticle
� Objective M Plan 10x, NA 0.25, WD 10.60

Optional Accessories :

� Objective MPlan 5X,
NA 0.10, WD 19.6mm
� Objective MPlan 20X,
NA 0.40, WD 12mm
� Objective MPlan 50X,
NA 0.50, WD 10.6mm
� Transmitted illuminator ( lamp house)
� Stage 250mm x 100mm