Products Catalog

Specification

Key benefits
• Easy to use, intuitive software makes highly
effective operation possible for novice users
• Characterize conductive and non-conductive
samples easily
• Minimize the amount of sample preparation:
low vacuum enables charge free imaging and
analysis of non-conductive specimens
• Increase analytical capabilities by enabling
accurate EDS and EBSD analysis on conductive
and non-conductive samples in high and low
vacuum thanks to the patented through-the-lens
pumping
• Stable high beam currents ( up to 2 ¼ A) enable
fast, accurate analytical analysis
• Enable surface imaging with optional beam
deceleration mode to get surface and
compositional information from conductive
samples